X射线光电子能谱仪的主要用途及测试价格

<p class="MsoNormal" style="text-align: left; mso-pagination: widow-orphan; background: white;" align="left"><span style="font-size: 14pt; font-family: arial, helvetica, sans-serif;"><span lang="EN-US" style="color: #333333;">X</span><span style="color: #333333;">射线光电子能谱<span lang="EN-US"> (XPS) </span>，是一种表面分析技术，主要用来表征材料表面元素及其化学状态。利用<span lang="EN-US">X</span>射线光子激发出物质表面原子内层电子或价电子并进行能量分析而获得的一种能谱。<span lang="EN-US"><br /></span></span></span></p> <p class="MsoNormal" style="text-align: left; mso-pagination: widow-orphan; background: white;" align="left"> </p> <p><span style="font-size: 14pt; font-family: arial, helvetica, sans-serif;"> </span></p> <p class="MsoNormal" style="text-align: left; mso-pagination: widow-orphan; background: white;" align="left"><span style="font-size: 14pt; font-family: arial, helvetica, sans-serif;"><span lang="EN-US" style="color: #333333;">XPS</span><span style="color: #333333;">不仅能探测样品表面的化学组成，还可确定除<span lang="EN-US">H</span>和<span lang="EN-US">He</span>以外周期表中所有元素化学状态，且灵敏度高，同时实验过程中对样品表面辐照损伤小，故在化学、材料科学及表面科学研究中被广泛应用，其主要用途有：<span lang="EN-US"><br /></span></span></span></p> <p class="MsoNormal" style="text-align: left; mso-pagination: widow-orphan; background: white;" align="left"> </p> <p><span style="font-size: 14pt; font-family: arial, helvetica, sans-serif;"> </span></p> <p class="MsoNormal" style="text-align: left; mso-pagination: widow-orphan; background: white;" align="left"><span style="font-size: 14pt; font-family: arial, helvetica, sans-serif;"><span lang="EN-US" style="color: #333333;">1. </span><span style="color: #333333;">表面定性与定量分析，可得到小于<span lang="EN-US">10um </span>空间分辨率的<span lang="EN-US">X</span>射线光电子能谱的全谱资讯。<span lang="EN-US"><br /></span></span></span></p> <p class="MsoNormal" style="text-align: left; mso-pagination: widow-orphan; background: white;" align="left"> </p> <p><span style="font-size: 14pt; font-family: arial, helvetica, sans-serif;"> </span></p> <p class="MsoNormal" style="text-align: left; mso-pagination: widow-orphan; background: white;" align="left"><span style="font-size: 14pt; font-family: arial, helvetica, sans-serif;"><span lang="EN-US" style="color: #333333;">2. </span><span style="color: #333333;">维持<span lang="EN-US">10um</span>以下的空间分辨率元素成分包括化学态的深度分析<span lang="EN-US">(</span>角分辨方式、氩离子或团簇离子刻蚀方式<span lang="EN-US">)</span>。<span lang="EN-US"><br /></span></span></span></p> <p class="MsoNormal" style="text-align: left; mso-pagination: widow-orphan; background: white;" align="left"> </p> <p><span style="font-size: 14pt; font-family: arial, helvetica, sans-serif;"> </span></p> <p class="MsoNormal" style="text-align: left; mso-pagination: widow-orphan; background: white;" align="left"><span style="font-size: 14pt; font-family: arial, helvetica, sans-serif;"><span lang="EN-US" style="color: #333333;">3. </span><span style="color: #333333;">线扫描或面扫描以得到线或面上的元素或化学态分布。<span lang="EN-US"><br /></span></span></span></p> <p class="MsoNormal" style="text-align: left; mso-pagination: widow-orphan; background: white;" align="left"> </p> <p><span style="font-size: 14pt; font-family: arial, helvetica, sans-serif;"> </span></p> <p class="MsoNormal" style="text-align: left; mso-pagination: widow-orphan; background: white;" align="left"><span style="font-size: 14pt; font-family: arial, helvetica, sans-serif;"><span lang="EN-US" style="color: #333333;">4. </span><span style="color: #333333;">成像功能。<span lang="EN-US"><br /></span></span></span></p> <p class="MsoNormal" style="text-align: left; mso-pagination: widow-orphan; background: white;" align="left"> </p> <p><span style="font-size: 14pt; font-family: arial, helvetica, sans-serif;"> </span></p> <p class="MsoNormal" style="text-align: left; mso-pagination: widow-orphan; background: white;" align="left"><span style="font-size: 14pt; font-family: arial, helvetica, sans-serif;"><span lang="EN-US" style="color: #333333;">5. </span><span style="color: #333333;">可进行样品的原位处理<span lang="EN-US"> AES</span>：<span lang="EN-US">(1)</span>可进行样品表面的微区选点分析<span lang="EN-US">(</span>包括点分析、线分析和面分析<span lang="EN-US">)</span>；<span lang="EN-US">(2)</span>可进行深度分析适合：<span lang="EN-US"> </span>纳米薄膜材料、微电子材料、催化剂、摩擦化学、高分子材料的表面和界面研究。<span lang="EN-US"><br /></span></span></span></p> <p class="MsoNormal" style="text-align: left; mso-pagination: widow-orphan; background: white;" align="left"> </p> <p><span style="font-size: 14pt; font-family: arial, helvetica, sans-serif;"> </span></p> <p class="MsoNormal" style="text-align: left; mso-pagination: widow-orphan; background: white;" align="left"><span style="font-size: 14pt; font-family: arial, helvetica, sans-serif; color: #333333;">传统<span lang="EN-US">X</span>射线光电子能谱的检测需在超高真空或高真空环境下进行，无法获得样品表面实时动态的现场原位变化信息。<span lang="EN-US"><br /></span></span></p> <p class="MsoNormal" style="text-align: left; mso-pagination: widow-orphan; background: white;" align="left"> </p> <p><span style="font-size: 14pt; font-family: arial, helvetica, sans-serif;"> </span></p> <p class="MsoNormal" style="text-align: left; mso-pagination: widow-orphan; background: white;" align="left"><span style="font-size: 14pt; font-family: arial, helvetica, sans-serif; color: #333333;">动态现场原位<span lang="EN-US">X</span>射线光电子能谱<span lang="EN-US">(NAP-XPS)</span>能够打破这一技术壁垒和限制，可以在接近常压的气氛和不同加热作用中，尽可能真实还原样品在反应状态下其表面元素化学状态及原子价态的动态现场原位变化过程。</span></p> <p class="MsoNormal" style="text-align: left; mso-pagination: widow-orphan; background: white;" align="left"> </p> <p class="MsoNormal" style="text-align: left; mso-pagination: widow-orphan; background: white;" align="left"><span style="font-size: 14pt; font-family: arial, helvetica, sans-serif;">科兴测试平台可做俄歇谱，价带谱，<span lang="EN-US">Ar</span>离子刻蚀，总谱，测试价格120元/样，欢迎联系送检。</span></p> <p> </p>